ChaMP X-ray point source catalog : J/ApJS/169/401

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Authors : Kim M. orcid , Kim D.-W., Wilkes B.J. (hide) , Kim D.-W., Wilkes B.J. et..al

VizieR DOI : 10.26093/cds/vizier.21690401
Bibcode : 2007ApJS..169..401K (ADS) (Simbad) (Objects)
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CDS Keywords : Surveys; X-ray sources
UAT : Surveys, X-ray sources

Observation (OC)

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Inserted into VizieR : 24-Aug-2009
Last modification : 04-Jul-2017

Chandra Multiwavelength Project X-ray point source catalog. (2007)

Keywords : catalogs - surveys - X-rays general

Abstract:We present the Chandra Multiwavelength Project (ChaMP) X-ray point source catalog with ~6800 X-ray sources detected in 149 Chandra observations covering ~10deg^2^. The full ChaMP catalog sample is 7 times larger than the initial published ChaMP catalog. The exposure time of the fields in our sample ranges from 0.9 to 124ks, corresponding to a deepest X-ray flux limit of f_0.5-8.0_=9x10^-16^ergs/cm^2^/s. The ChaMP X-ray data have been uniformly reduced and analyzed with ChaMP-specific pipelines and then carefully validated by visual inspection. The ChaMP catalog includes X-ray photometric data in eight different energy bands as well as X-ray spectral hardness ratios and colors. To best utilize the ChaMP ...(more)
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American Astronomical Society policies

  • B/chandra : The Chandra Archive Log (CXC, 1999-)
  • VIII/28 : Bell Laboratories H I Survey (Stark+ 1992)
  • J/ApJS/150/19 : ChaMP. I. First X-ray source catalog (Kim+, 2004)

                


                

                    

                


                

                    

                


                

                    
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